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XC9572XL-10TQG100I

工厂型号: XC9572XL-10TQG100I
型号类别: 可编程逻辑 IC
厂商: XILINX
型号: XC9572XL-10TQG100I
批号:
数量: 14663
更新日期: 2011/09/20

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描述

特点

应用

XC9572XL-10TQG100I 描述

    Programmable low and high gain (<2 dB resolution)   Low range: −11 dB to +17 dB   High range: +6 dB to +34 dB Differential input and output:   200 Ω differential input   100 Ω differential output 7 dB noise figure @ maximum gain Two-tone IP3 of +35 dBm @ 70 MHz −3 dB bandwidth of 750 MHz 40 dB precision gain range Serial 8-bit digital interface Wide input dynamic range Power-down feature Single 3 V to 5 V supply

XC9572XL-10TQG100I 特点

    The microprocessor monitor circuitry of the XC9572XL-10TQG100I provides three basic functions. First, a precision temperature-compensated reference and comparator circuit monitors the status of VCC. When an out-of- tolerance condition occurs, an internal power-fail signal is generated which forces the reset to the active state. When VCC returns to an in-tolerance condition, the reset signals are kept in the active state for 250 ms to allow the power supply and processor to stabilize. The second microprocessor monitor function is pushbutton reset control. The XC9572XL-10TQG100I debounces a pushbutton input and guarantees an active reset pulse width of 250 ms. The third function is a watchdog timer. The XC9572XL-10TQG100I has an internal timer that forces the reset signals to the active state if the strobe input is not driven low prior to watchdog time-out.

XC9572XL-10TQG100I 应用

    BIAS CURRENT TEST A functional diagram of the bias current test circuit is shown in Figure 1 The output of the triangular wave generator and the output of the test circuit respectively drive the horizon- tal and vertical deflection of an oscilloscope The device under test (cascaded with the integrator A7) is connected in a differential amplifier configuration by R1 R2 R3 and R4 The inputs of this differential amplifier are driven in common from the output of the triangular wave generator through attenuator R8 and amplifier A8 The inputs of the device under test are connected to the feedback network through resistors R5 and R6 shunted by the switch S5a and S5b
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